The second volume of Analog Circuit Design, Immersion in the Black Art of Analog Design by Bob Dobkin and Jim Williams has just been published.
A companion volume to Analog Circuit Design: A Tutorial Guide to Applications and Solutions, this edition includes new application notes on power management, data conversion and signal conditioning circuit solutions, and an extensive circuit collection of reference designs.
The content is based on the research and writing of analog design experts Bob Dobkin and the late Jim Williams, as well as industry experts Carl Nelson and Bob Widlar, all associated with Linear Technology and earlier with analog powerhouses in Silicon Valley.
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The book aims resolving design issues created by digital systems, wireless communications, complex industrial and automotive systems, designers which all require sophisticated analog solutions.
This in-depth source book of circuit design solutions supplies engineers with practical design techniques that focus on common analog challenges, according to its publisher, Elsevier. The full support package includes online resources such as data sheets, design notes and LTspice design simulation software tools from Linear Technology.
Volume 2, Immersion in the Black Art of Analog Design continues to demystify analog circuit design with new application notes on power management, data conversion and signal conditioning circuit solutions, and an extensive circuit collection of reference designs, according to Elsevier.
One of our field applications guys wanted to know the input resistance of one of our ADCs; a customer had asked him and couldn’t find the data. Like most integrated ADCs these days, this one (the SAR ADC in our PSoC 4 family of devices) has a switched-capacitor front end and, in the interests of maximum flexibility and minimum power consumption, we don’t fit an input buffer amplifier. We let you do that if you want, but sometimes people want to ‘go native’ and feed the ADC directly.
When your home’s deep freezer, full of food, experiences an AC power failure while you are out for an extended time, its contents can thaw out. If the AC power is then restored before you return home, the contents can re-freeze and you may never know that your food is spoiled. This has given rise over the years to a number of freezer-alarm circuits and methods to detect thaw and re-freeze.
It seems like we just had LTE and LTE Advanced beginning deployment in base stations everywhere. In spite of that effort, there has been heavy discussion of early development ideas of the 5G next-gen architecture to meet the ever-growing demands of the cellular airwave capacity, speed and customer future needs.
If you have worked in the semiconductor industry for more than a few years I am sure you have heard senior leadership speak about the need for your integrated circuit designs to be first pass successes and not the typical two to three spins or more to reach the targeted performance. The question is this: Is first pass success feasible and should be expected? I do not want to stir up a hornets nest with my response but the answer to the question is that it depends. Depends on what you say? Well, the answer depends on several different interwoven complexities that can determine if first pass success is possible. I would like to explore some possible ways to answer this question. Furthermore, the complexity of this question increases when developing complex mixed signal IC’s.
Fortunately for circuit designers, a new tool is available that can simplify the process of identifying the ESD suppression device best suited to an application, which makes it far easier to incorporate circuit protection earlier in the board planning process. The Littelfuse iDesign™ Online Simulation and Product Selection Tool