Test Engineer of the Year 2012

Broadcom's Brad Davis takes home the award at this year's DesignCon for design-verification testing on mobility system on chip (SOC) designs, inclding the BCM4330 combo chip.

Test & Measurement World’s annual Test Engineer of the Year award honors the special contributions that test engineers make to the quality of electronics products and systems. In our November 2011 issue, we described the accomplishments of six outstanding test engineers and asked our readers to vote for the engineer they believed was most deserving of the 2012 Test Engineer of the Year award. The winner: Brad Davis of Broadcom.

“Test engineering in this field demands multiple skills,” observed John Ma, manager of DVT (design-verification testing) for Wi-Fi modules at Broadcom. “You need to understand RF, test hardware, and programing for test automation. Plus, you need to be sensitive to important business perspectives. Brad Davis is one of the rare individuals who possesses all of those skills. On top of that, he just loves testing as a job.”

Davis received the award on January 31, 2012, during the Best in Test awards ceremony, held in conjunction with the 2012 DesignCon event in Santa Clara, CA. As part of his award, Davis will designate an engineering program to receive a $10,000 grant, sponsored for the ninth consecutive year by National Instruments.

To go directly to the complete article by Lawrence D. Maloney, Contributing Editor -- Test & Measurement World, follow the jump.