Some more thoughts on the IMS2013 show, the JESD204B serial data transfer standard, interleaved ADCs, and most importantly, overvoltage protection.
What is an RF-DAC? Where are they used? Why can we consider them part of the family of analog-integrated devices?
This is the third blog in the series about the ways that test instrumentation can be integrated onto an IC -- and the advantages that accrue from doing so.
We like to have comprehensive engineering solutions to design problems, but reality is that the line between improvisation and best practices is often fuzzy.
Does the need for perfection stand in the way of using integrated analog devices? Or does the use of integrated analog devices stand in the way of designing the best circuit possible?
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