This is the third blog in the series about the ways that test instrumentation can be integrated onto an IC -- and the advantages that accrue from doing so.
We like to have comprehensive engineering solutions to design problems, but reality is that the line between improvisation and best practices is often fuzzy.
Does the need for perfection stand in the way of using integrated analog devices? Or does the use of integrated analog devices stand in the way of designing the best circuit possible?
Some thoughts on the IMS2013 show and the JESD204B serial data transfer standard.
In the field of design automation, coming up with a way to speed up circuit analysis can create a superior product.
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