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Analog Angle Article

“Also of Interest” and “Elementals” for April 4, 2011

Each week, the editor of Planet Analog finds items of interest and then features them in two sections, entitled “Also of Interest” and “Elementals”. Each cites items from publications outside the Planet Analog and EETimes portfolios. And we also have an archive of recent weekly Planet Analog Newsletters, as pdf files; see the list at the very bottom.

“Also of Interest” and “Elementals” is an extension of our belief that engineers are interested in on-going tutorial on obviously relevant topics, as well as the serendipity of exploring topics which are not directly related to their jobs, but which will broaden their knowledge and sometimes spurs innovative and creative approaches. The first box highlights items of general interest to the engineer, while the second highlights basic and tutorial electronic-engineering material. Among the publications we check are IEEE Spectrum , Machine Design , Design News , Laser Focus World , EDN , Electronic Design , NASA Tech Briefs , Microwave Journal , RF & Microwaves , and Physics Today , plus others.

Consider these items as online extras, and worth a look. (Please note: there are also links to the previous weeks' editions, in the “Navigate” box to the right.)

Also of Interest:

  • A new breed of ruggedized servers designed to use COTS (commercial off-the-shelf) motherboards offer a versatile platform that can keep up with complex and ever increasing processing demands:
    “Redesigning COTS Servers for Military Applications,”
    Defense Tech Briefs , February 2011
  • Nitride lasers have reached the crucial 520-530 nm band in the laboratory. Now developers are in a horse race to perfect the fabrication techniques needed to manufacture practical green laser diodes.:
    “The quest for practical green laser diodes,”
    Laser Focus World , December 2010
  • Ruggedization strategies to meet SWaP (size, weight, and power) and performance needs within harsh military environments:
    “When the Going Gets Tough…,”
    Defense Tech Briefs , February 2011
  • Hybrid metrology methods are a potential solution to achieving critical dimension metrology with sub-nanometer measurement uncertainty:
    “Nanoscale measurement tests metrologists,”
    Laser Focus World , December 2010

Elementals:

  • Comparing conventional and orthogonal polynomial models with and without memory effects shows how these models can be used to emulate the nonlinear behavior of power amplifiers:
    “Model PAs With Wideband Signals,”
    Microwaves & RF , December 2010
  • Overview of the improvements in large-signal device characterization brought on by a new class of vector-receiver load pull systems:
    “Vector-receiver Load Pull Measurements,”
    Microwave Journal , February 2011
  • When analyzing transistors, there is a finite allowable signal level that provides accurate results, which is due to a phenomenon related to the large signal effects of semiconductor junctions:
    “Why Network Analyzer Signal Levels Affect Measurement Results,”
    Power Electronics Technology , January 2011
  • Understanding measurement accuracy lets you appreciate why instruments don't give perfect readings and helps you mitigate the inevitable errors:
    “Manage your measurement errors,”
    Test & Measurement World , February 2011

Recent Planet Analog Newsletters:

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