Each week, the editor of Planet Analog finds items of interest and features and puts them into two sections, entitled “Also of Interest” and “Elementals”. Each cites items from publications outside the Planet Analog and EETimes portfolios.
It's an extension of our belief that engineers are interested in on-going tutorial on obviously relevant topics, as well as the serendipity of exploring topics which are not directly related to their jobs, but which will broaden their knowledge and sometimes spurs innovative and creative approaches. The first box highlights a few items of general interest to the engineer, while the second highlights some basic and tutorial electronic-engineering material.
Among the publications we check are IEEE Spectrum , Machine Design , Design News , Laser Focus World , EDN , Electronic Design , NASA Tech Briefs , and Physics Today , among others.
Consider these items as “online-only” extras, and worth a look! (Please note: there are also links to the previous weeks' editions, at the bottom).
Also of Interest:
- For at least a decade, finite element analysis has been guiding design decisions and helping companies avoid having to build and test several prototypes:
“FE Update: Expecting too much From FEA,”
Machine Design , June 5, 2008
- Judicious component layout plays a large role in immunizing test and control systems against electrical interference:
“Top tips on squelching electrical noise,”
Machine Design , June 19, 2008
- Advances in high-speed imaging systems make it possible to record ultra-high-speed movements of biological systems:
“High-speed images capture processes in botanical systems,”
Laser Focus World , May 2008
- Powerful new techniques use fluorescence imaging and nonlinear techniques to probe cells; developers hope to produce a new generation of clinical tests:
“Microscopy Techniques – The quest to see inside living cells is driving new optical microscopy,”
Laser Focus World, May 2008
- Pease Porridge on this simple but misunderstood circuit function:
“What’s All This Current-Source Stuff, Anyhow?,”
Electronic Design , June 26, 2008
- The comprehensive measurement capabilities and high accuracy of real-time spectrum analyzers make them ideal test tools for characterizing modern pulsed radar signals:
“Making Advanced Radar Measurements,”
Microwaves & RF , June 2008
- Laboratory test procedures measure photovoltaic cells and modules according to
“Photovoltaic Test Performance,”
Photonics Spectra , June 2008