Each week, the Planet Analog section of the print version of EETimes features two small text boxes, entitled “Also of Interest” and “Elementals”, in addition to one or two feature articles, an editor's column, and new products. Each of these boxes cites items from publications outside the Planet Analog and EETimes portfolio. The first box highlights a few items of general interest to the engineer, while the second highlights some basic and tutorial electronic-engineering material.

In this week's print edition (May 5, 2008 you'll see these items (note: there are also links to previous weeks' editions, at the bottom):

Also of Interest:

• -Finite element material models are used to evaluate the reliability of lead-free solders:
  “Creep Analysis of Lead-Free Solders Undergoing Thermal Loading,”
  NASA Tech Briefs , February 2008
• With Australia's desert as its raceway, the World Solar Challenge illuminates some of the best electric-vehicle technology:
  “Across the Outback on Photons Alone,”
  IEEE Spectrum , February 2008

Elementals:

• Engineers show how to improve jitter and BER testing for SerDes devices:
  “Accelerate and simplify serial data testing,”
  Test & Measurement World , February 2008
• A review of noise characteristics, measurement parameters and its applications for measurement of communication circuits and systems:
  Frequently Asked Questions About Noise,”
  High Frequency Electronics , February 2008
• This paper, first published in May of 1960, explored a new method of measuring the Q for solid-state diodes:
  “Parametric Diode Q Measurements,”
  Microwave Journal , March 2008

Previous Editions:

• April 28, 2008
• April 21, 2008
• April 14, 2008
• April 7, 2008
• March 31, 2008