REGISTER | LOGIN
Home    Bloggers    Blogs    Article Archives    Messages    About Us   
Tw  |  Fb  |  In  |  Rss
Jonathan Harris

Interleaving Spurs: Let’s Look at the Math

Jonathan Harris
markgrogan
markgrogan
8/8/2018 11:17:15 AM
User Rank
Newbie
Re: Re : Interleaving Spurs: Let's Look at the Math
Math is what calculators are for right? And of course while we get to tinker around with the engineering and designing and stuff, we need to make sure that everything goes somewhat successfully right from the get go! But I love your analogy here. I'm definitely looking forward to trying some things out on my own!

50%
50%
jonharris0
jonharris0
9/30/2013 8:02:58 PM
User Rank
Blogger
Re: Re : Interleaving Spurs: Let's Look at the Math
That is correct Sunita.  Now that we've explored the mismatches, I thought it appropriate to start quantifying the level of the spurs caused by these mismatches.

50%
50%
SunitaT0
SunitaT0
9/30/2013 4:55:22 PM
User Rank
Master
Re : Interleaving Spurs: Let's Look at the Math
There are several challenges to look out for while interleaving ADCs.  Spurs appear in the output band that outcomes from the inadequacies related with inter leaving ADCs.  The deficiencies are essentially misalliances between the 2 ADCs that are interleaved.  There are 4 elementary misalliances that outcome in spurs in the production of band.  These are gain mismatch, offset mismatch bandwidth mismatch and timing mismatch.

50%
50%
More Blogs from Jonathan Harris
There are many screening steps performed on space qualified components. In this installment we will pick up at step 18 with Group A screening.
Space screening for the standard space product offerings which include products such as ADCs, DACs, comparators, amplifiers, voltage references, switches, isolators, regulators, and attenuators
Designs for space applications are commonly created with mission life expectations reaching 15 to 20 years and even longer in some cases
I’d like to take a step back from the details and specifics related to radiation testing and focus a bit on some of the reasons that advanced testing and screening is performed on space qualified products.
Technically an SET could also be considered as an SEU for a high speed ADC since it is likely that an ion strike could cause an SEU that results in a transient event that we would call an SET.
flash poll
educational resources
 
follow Planet Analog on Twitter
Planet Analog Twitter Feed
like us on facebook
our partners
Planet Analog
About Us     Contact Us     Help     Register     Twitter     Facebook     RSS