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Jonathan Harris

Single Event Effects (SEEs) with High Speed ADCs: Single Event Transient (SET), Part 2

Jonathan Harris
jonharris0
jonharris0
8/14/2018 6:58:06 PM
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Re: hi
Hi Paul, if you are referring to the test setup diagram this is simply how the device is connected to perform the radiation testing.  The application circuit would look different and would depend on the particular application that the ADC is being used for, i.e. communications, test/measurement, radar, etc.

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PaulChau
PaulChau
8/14/2018 3:48:16 AM
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Re: hi
Just wondering about the applications of this diagram. Can anybody please provide a bit of context into what systems that these may be used? Surely there is some write up that accompanies this, but for some reason I can't seem to find it! Would be most grateful to whoever can provide some information on  this for me! Thanks in advance!

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PaulChau
PaulChau
8/14/2018 2:58:15 AM
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Newbie
hi
Just wondering about the applications of this diagram. Can anybody please provide a bit of context into what systems that these may be used? Surely there is some write up that accompanies this, but for some reason I can't seem to find it! Would be most grateful to whoever can provide some information on  this for me! Thanks in advance!

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More Blogs from Jonathan Harris
Designs for space applications are commonly created with mission life expectations reaching 15 to 20 years and even longer in some cases
Iíd like to take a step back from the details and specifics related to radiation testing and focus a bit on some of the reasons that advanced testing and screening is performed on space qualified products.
Technically an SET could also be considered as an SEU for a high speed ADC since it is likely that an ion strike could cause an SEU that results in a transient event that we would call an SET.
Now letís move to our next SEE topic which is single event transients (SETs)
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