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Jonathan Harris

Single Event Effects (SEEs) with High Speed ADCs: Single Event Upset (SEU)

Jonathan Harris
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There are many screening steps performed on space qualified components. In this installment we will pick up at step 18 with Group A screening.
Space screening for the standard space product offerings which include products such as ADCs, DACs, comparators, amplifiers, voltage references, switches, isolators, regulators, and attenuators
Designs for space applications are commonly created with mission life expectations reaching 15 to 20 years and even longer in some cases
Iíd like to take a step back from the details and specifics related to radiation testing and focus a bit on some of the reasons that advanced testing and screening is performed on space qualified products.
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