Home    Bloggers    Blogs    Article Archives    Messages    About Us   
Tw  |  Fb  |  In  |  Rss
Chris Jakubiec

eGaN® Technology Reliability and Physics of Failure Blog #2

Robert Strittmatter
Page 1 / 3 Next >
More Blogs from Chris Jakubiec
This installment will provide an overview of the physics of failure associated with voltage bias at the gate electrode of gallium nitride (GaN) field effect transistors (FETs).
In this installment we will examine the stress tests that EPC devices are subjected to prior to being considered qualified products
flash poll
educational resources
follow Planet Analog on Twitter
Planet Analog Twitter Feed
like us on facebook
our partners
Planet Analog
About Us     Contact Us     Help     Register     Twitter     Facebook     RSS