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William Murray

High-Reliability Designs Reqire Sophisticated High-Reliability Testing

William Murray
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BillWM
BillWM
11/30/2013 12:12:12 PM
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Re: Re : High-Reliability Designs Reqire Sophisticated High-Reliability Testing
Google electromigration reduction patents

 

http://www.google.com/patents/US7861204

 

https://www.google.com/search?q=patent+electromigration+reduce+&ie=utf-8&oe=utf-8&aq=t

 

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yalanand
yalanand
11/30/2013 11:39:30 AM
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Re: Re : High-Reliability Designs Reqire Sophisticated High-Reliability Testing
one of my old managers had a patent on reducing electro-migration via special features in  the die as well.

@William, thanks for the reply. I never knew we could reduce electro-migration via special features in die. If possible please share more details about this technique. 

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BillWM
BillWM
11/30/2013 8:51:13 AM
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Re: Re : High-Reliability Designs Reqire Sophisticated High-Reliability Testing
Basically the issues are  temperature and voltage in relation to feature size related -- This means if one can afford more NRE for better design software it is able to check for more of these issues -- one of my old managers had a patent on reducing electro-migration via special features in  the die as well.   There may be other methods as well.

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yalanand
yalanand
11/30/2013 8:28:45 AM
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Re : High-Reliability Designs Reqire Sophisticated High-Reliability Testing
@William, thanks for this post. I want to know more about this metal migration problem in IC. How can we solve this problem for higher reliability of IC? Can we do anything during different stages of development of IC to avoid metal migration problems ?

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goafrit2
goafrit2
9/12/2013 6:39:33 AM
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Re: Coax reliability
>> I actually did a log on the late MCC about it as well, but all that is left is this YouTube video

Very cool one - seems like the MCC site is redirected for the content.

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goafrit2
goafrit2
9/12/2013 6:38:23 AM
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Re: Coax reliability
@William, the case of coax is a real challenge. The problem is that the degradation happens in ways that one may not even notice it. We may need better dielectric design and stronger shielding to avoid the collapse

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antedeluvian2
antedeluvian2
9/10/2013 2:59:14 PM
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Re: Coax reliability
goafrit

 

 I continue to ask the day we will have "cordless" scopes. But it seems the EMI and others will not allow that.

It may be closer than you think. Take a gander at this. I actually did a log on the late MCC about it as well, but all that is left is this YouTube video

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BillWM
BillWM
9/8/2013 2:15:34 PM
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Re: Coax reliability
Elaboration -- Often there is coax that will take 8hrs at say 125 deg C -- Try and use it for 80hrs at 125C and the dielectric filler flows and the shield collapses and shorts to the center conductor!

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goafrit2
goafrit2
9/8/2013 6:32:44 AM
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Re: Coax reliability
>>  have killed many of these new scope probes from the various vendors trying to figure out how to do High Rel Testing of High Speed Signals

Good point. I continue to ask the day we will have "cordless" scopes. But it seems the EMI and others will not allow that. A product is a complete package - it is all about the weakest link.

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goafrit2
goafrit2
9/8/2013 6:28:18 AM
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Master
Re: Coax reliability
The Apple VP that supervised the design of iPhone antenna that resulted to the antenn-gate "scandal" lost his job. It is high time we understand that great design requires great testing to work.

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