JFET op-amp advances IC test-and-measurement

Santa Clara, Calif.&#8212NEC Electronics' JFET-class dual operational amplifier for integrated-circuit test applications, the &#956PC835, touts a high slew rate, high capacitive load capability (four times higher than competing products), and a small package (3-by-3 mm TSSOP) for IC, memory, system-on-chip (SOC) and logic test equipment.

“We recognized the need for designers to have an op- amp designed specifically to meet the unique needs of semiconductor test equipment and responded with the &#956PC835,” said Bart Ladd, general manager for the Standard Solutions Strategic Business Unit. “This product provides the high slew rates, high capacitive loads and small size necessary to power the test equipment used to verify next-generation semiconductors.”

The &#956PC835 provides stable operation for a 4000 pF load, thus allowing designers to test for higher capacitive loads per channel and a wider variety of ICs with different capacitances. Its slew rate is 9 V/&#956s to enable more precise measurements, while the small TSSOP can be used in compact, dense designs where large arrays are required. The op-amp also features low input offset&#8212 just &plusmn3 mV maximum.

Click here to access the device's datasheet. The op amp is priced at $1.20 each in sample quantities. Volume production is scheduled to begin in October. Pricing and availability are subject to change.

NEC Electronics America , 1-408-588-6000,

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