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Power measurements at APEC 2018

While visiting the Teledyne LeCroy booth for my appointment with Hilary Lustig at the APEC 2108 exhibit floor, I was shown the very impressive MDA810A, a 1GHz, 8-channel, 10 GS/s, 50 Mpts/Ch Motor Drive Analyzer. See Figure 1.

Figure 1

The MDA810A Motor Drive Analyzer (Image courtesy of Loretta Taranovich)

The MDA810A Motor Drive Analyzer (Image courtesy of Loretta Taranovich)

I was also shown the HDO8108A, an 8-channel, 12-bit, 1 GHz high-definition oscilloscope which could accurately display three-phase power analysis, device loss measurements, half-, full-, or cascaded H-Bridge debug, Switch-mode Power Supply validation, Grid-tied PV Inverter analysis, Motor Drive analysis, DC/DC Converter analysis, and so much more from Teledyne LeCroy’s offerings. See Figure 2.

Figure 2

The HDO8108A technology series of HD oscilloscopes (Image courtesy of Teledyne LeCroy)

The HDO8108A technology series of HD oscilloscopes (Image courtesy of Teledyne LeCroy)

I was impressed, especially with their HVF0103 high-voltage, fiber-optically-isolated probes.

What really gave me insight into what this system could do was when I happened to pass a booth at APEC that belonged to a company from Taiwan called STAr Technologies which was displaying their Dynamic AC test system for Power Transistors. That system is called the Taurus-PDAT (Power Device Analytical Tester).

The Taurus-PDAT system was being demonstrated at this booth and it was showing the various test capabilities for power MOSFETs and IGBTs in testing of their dynamic AC performance with test modes for switching, reverse bias Safe Operating Area (SOA), diode recovery, gate charge, unclamped inductive load, and short circuit at high energies like 1500V/1000A short circuit and very high bandwidth slew rates of more than 10,000A/us inductive switching tests.

The other piece of equipment displaying all of these results was the Teledyne LeCroy HDO8108A High Definition oscilloscope system. See Figure 3.

Figure 3

The Teledyne LeCroy HDO8108A system was right at the center of this display showing performance of power devices (Image courtesy of Loretta Taranovich)

The Teledyne LeCroy HDO8108A system was right at the center of this display showing performance of power devices (Image courtesy of Loretta Taranovich)

Figure 4

David Brackman from STAr Technologies explained the features of his Taurus PDAT system to me and he commented on the importance of the HDO8108A by Teledyne LeCroy in his setup. (Image courtesy of Loretta Taranovich)

David Brackman from STAr Technologies explained the features of his Taurus PDAT system to me and he commented on the importance of the HDO8108A by Teledyne LeCroy in his setup. (Image courtesy of Loretta Taranovich)

I saw the complexity of testing such power devices and the excellent customized sockets, thermal chambers, and probing solutions that STAr Technologies provides to the industry. Coupled with the HDO8108A, this system provides companies that manufacture power devices a means to accurately characterize their products for reliable performance in end-customer systems.

Since probes are a critical part of such systems, I wanted to show Teledyne LeCroy’s newest on-demand webinar – Probing in Power Electronics – What to Use and Why.

Power electronics designs inherently have high voltage signal levels and signals “floating” on top of high voltages. This has led to developments of many specialized high voltage single-ended and differential probes and amplifiers to meet the specific needs of this market. However, the selection of the right probe topology and type is critical not only to operator, equipment and DUT safety, but also has a large influence on the accuracy of the measurement.

In this webinar they provide an overview of the different HV rated probe specifications and topologies, explain what measurement each probe topology is ideally suited for, and provide real-word examples and comparisons between a variety of different probes and amplifiers.

To View the webinar, click here.

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