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Single and dual comparators aim to solve supply chain management challenges

Fairchild Semiconductor has developed the FAN156 low voltage comparator and the FAN256 dual low voltage comparator to provide supply chain flexibility.

Engineers at Fairchild have applied existing core design IP for comparator technology to rapidly develop devices to meet specific customer demands. By having both single and dual low voltage comparator options, the solution provided the customer the flexibility they needed by offering the option to use one or the other – or both – depending on the application requirements. In addition, it simplified their supply chain management having both solutions available from one source.

The FAN156 and FAN256 are low power comparators that typically consume less than 10 µA of supply current. They are guaranteed to operate at a low voltage of 1.6 V and are fully operational up to 5.5 V, making them ideal for use in 1.8 V, 3.0 V and 5.0 V systems. These comparators are ideal for applications including mobile phones, alarm and security systems, personal digital assistants, computers and portable medical devices.

In mobile applications, the FAN156 and FAN256 help reduce the 3-times falling issue associated with slow insertion of an audio headset jack, as well as enable different audio headset jacks to be used in the same device. Both devices feature a complementary push-pull P and N-channel output stage capable of driving a rail-to-rail output swing with a load ranging up to 5.0 mA.

The FAN156 is packaged in 6-lead, 1.0 x 1.45 mm MicroPak package, while the FAN256 is packaged in an 8-lead, 1.6 x 1.6 mm MicroPak package.

Samples available of the FAN156 and FAN256 voltage comparators are now available.

The FAN156 is priced $0.12 in 1,000 quantity pieces while the FAN256 is priced $0.18 in 1,000 quantity pieces.

More information about the FAN156 and FAN256 voltage comparators at http://www.fairchildsemi.com/ds/FA/FAN156.pdf .

http://www.fairchildsemi.com/ds/FA/FAN256.pdf .

This article originally appeared on EE Times Europe.

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