TI’s 16-bit, 500-Msamples/s dual-channel D/A converter targets 3G wireless basestations

Cannes, France — Texas Instruments Inc. (TI) rolled out its next-generation high performance, dual-channel 500-Msamples/s, D/A converter at the 3GSM World Congress forum this week, which it claims not only decreases noise, but also reduces radio frequency design requirements and basestation costs.

The DAC5687 digital-to-analog converter (D/A converter) offers optimized gain, phase and offset control features for direct up-conversion architectures using IQ modulators in 3G basestations. This 500-megasamples per second (Msamples/s) device also supports today's 3G clock rates, including the more popular 491.52 megahertz.

The DAC5687 delivers a signal-to-noise-ratio (SNR) greater than 75 dBFS and 3rd order intermodulation (IMD3) greater than 81 dBc, while allowing multicarrier systems to operate with higher output power. Additionally, dissipating 700 milliwatts at 500-Msamples/s, the DAC5687 also improves system reliability and enables higher basestation channel density. This new addition to TI's family of D/A converters features flexible modes of operation and is pin compatible with TI's prior generation (DAC5686).

The DAC5687 includes integrated 2x, 4x, and 8x interpolation filters, a complex numerically-controlled oscillator (NCO), on-board clock multiplier, IQ compensation, and on-chip voltage reference.

The photo below is a block diagram of the DAC5687 in X2 mode.

An evaluation module is available (DAC5687EVM). Sample units of the DAC5687 are available now. Production units will be available in April 2005 for $22.50 per 1,000 units.

Click here for the TI DAC5687 data sheet.

For more information, please call 1-800-477-8924 or visit:

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